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|MANUFACTURER||Netzsch Geratebau GmbH (manufacturer's website)|
|MODEL||Netzsch Geratebau GmbH|
|CONTACT 1||Jan Fairless|
|CONTACT 2||Ken Madden|
|Enquire about this item|
Broadest temperature range available, from -100°C to 500°C With a single instrument setup – that is, without having to swap out either the detector or the furnace – the LFA 467 HyperFlash® can carry out measurements from -100°C to 500°C. Coupled with the broadest range of accessories available on the market, the instrument opens the door to completely new dimensions in the determination of thermophysical properties.
Sample throughput up to 4 times higher due to sample holder for 16 samples One unique advantage of the LFA 467 HyperFlash® is its ability to simultaneously measure up to 16 samples over the entire temperature range. This allows for maximum sample throughput with a minimum input of operational time and effort. Refill systems are available for automatic refilling of the Dewar on both the detector and the furnace, allowing uninterrupted operation of the LFA system around the clock.
ZoomOptics for more precise measurement results without measurement errors The patented ZoomOptics system (patent no.: DE 10 2012 106 955 B4 2014.04.03) optimizes the field of view of the detector, thus eliminating any influences caused by aperture stops. The result is a significant increase in the precision of the measurement results.
Ultra-fast recording of measurement data for thin samples (2 MHz) Thin films and high-conductivity materials require a very high data acquisition rate for the precise recording of rapid temperature increases on a sample’s upper surface. The LFA 467 HyperFlash® offers a sampling rate of 2 MHz – an unprecedented value for LFA systems.
with only one single furnaceContactless measurement of the temperature increase with IR detectorData acquisition rate: up to 2 MHz (for both thermal curve and pulse mapping)Measuring range thermal diffusivity: 0.01 mm2/s to 1000 mm2/sMeasuring range thermal conductivity: < 0.1 W/(mK) to 2000 W/(mK)Sample dimensions: 6 mm to 25.4 mm diameter 0.01 mm to 6 mm thickness Patented pulse mapping technique for pulse length correction and improved cp determinationCompliant to and in accordance with: ASTM E1461, ASTM E2585, DIN EN 821-2, DIN 30905, ISO 22007-4, ISO 18755, ISO 13826; DIN EN 1159-2, etc.
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Last Updated: 19th October, 2015